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The 4 in 1 Mega-Idea Motherboard Layered Test Fixture is designed for motherboard testing of iPhone 17 series devices. It is compatible with iPhone 17, 17 Air, 17 Pro, and 17 Pro Max models, providing high-precision testing capabilities.
Product Type: Repair Fixture
Compatibility: iPhone 17, 17 Air, 17 Pro, 17 Pro Max
Material: BeCu spring probes
Key Feature: High-precision machining
Intended Use: Motherboard testing
Dimensions: Not specified
Color/Variant: Not specified
Probe Type: Double-headed probe for accurate alignment
Contact Performance: Improved with fixed buckles to prevent motherboard warping
Conductivity: Good conductivity with stable overload
Accuracy: Small deviation in detected values
Probe Staining: Tapered probe resists staining from rosin and solder
Spring Mechanism: Quick rebound for convenience
Foot Pads: Anti-slip, wear-resistant for stability
SKU:
EDA0089215
Product Origin:
China
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Verified Compatible
Guaranteed fit for device in the title. Wrong part? Full refund including shipping.
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